It would seem to be A way to verify that the crystal itself is operational, but may not say much beyond that.
Presumably, the idea is that the voltage pulse stresses the crystal, and upon release of the input, the crystal relaxes and generates essentially a transient response equivalent to the effect of a step function shock input.
This is a quick & dirty check, but there's no means of verifying that the transfer characteristic of the housing and mounting haven't been perturbed.
TTFN