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It makes much less sense for features with protruding interruptions.
Perhaps this is less of a problem with a CMM or some other advanced metrology devices and software aids
can you use the CMM to "virtualize" a 42.95 wide MMC gage to the full 15.1 maximum height of the part that will only detect interference between the intended feature and it's MMC boundary, and "ignore" interference of the protruding tabs with that boundary?
Relation of CF with rule #1:
the CMM software i am using at the moment does not have the capabilities you mentioned. regarding Datum feature B from the old sketch , you could take a series of points on 4 planes then try look at the individual points and create a plane from the highest points etc but very difficult to do.
I haven't been following this discussion closely, but maybe the thinking here was to maintain the relationship of the datum features to each other. The profile tolerance of 0.1 references A, B-C, D so it's good practice to use GD&T to relate D to the higher-order datum B-C.chez311 said:The perpendicularity tolerance on the width D should be removed.
could i use to parallel planes pushed up against the radii as Datum feature simulators
In a similar way, I might even suggest something to relate datum features B and C back to A
Rwelch9 said:I will apply the CF back into the drawing as for me this is easier on the drawing and will free up space also.