This has been a very interesting thread. I have actually wondered about the use of the negative pole on the DC test set as well.
We still use DC testing for new cables, but avoid it on field-aged cables.
We have been heading towards VLF (Very Low Frequency) AC hipotting for testing our field-aged solid dielectric cables. By using VLF hipots, you take advantage of the frequency-dependent characteristic of the cable's capacitance.
(Recall the impedance model of a capacitor Z = 1/(j*2*pi*f*C) )
A lot of the research floating around these days suggests that XLPE insulation does not perform well after a DC voltage has been applied. It has a sensitivity to DC stress that can be described as a 'memory' that shows up after the cable has been exposed to DC and then de-energized. The XLPE (and TRXLPE) molecules are polar and take on a set when exposed to a unidirectional electric field. The tendancy of the XLPE molecules to rotate back to the orientation that the DC field placed them in creates space charges in the insulation. (Return-voltage diagnostic methods rely on the development of the space charges that result from DC exposure).
So DC has it's uses, but when the cable is tested with DC and then re-energized too early with AC, the space charges (which may not dissipate for many hours) cause stress enhancements in the bulk of the insulation. Those areas of intensified voltage stress are likely to become failure sites, either at some point in the future or almost immediately upon re-energization.
OK. I've probably strayed outside the scope of this discussion, but I have one last question for those who have posted to this thread...
Is VLF testing the same direction others are taking?
Thanks,
Kraigb