cuky2000-
I take some serious points with both of the papers you posted (which I am familiar with).
The GE paper (I believe) has some wrong/misleading statements:
1) It says CVTs perform better (transient-wise)when the applied burden is higher, which is completely backwards. They perform better as the applied burden is lower.
2) Is lists 2 types of ferroresonance suppression circuit types, active and passive. The 2 main CCVT suppliers in North America (Ritz and Trench) both use passive circuits, which perform much better than active circuits. Most of the info and simulations they show arew based on active supression devices, which are generally not accepted in the US and Canada.
3) The values they are using for the stack capacitances are way off for 500 kV applications. They are correct in saying that higher capacitances CAN lead to better TR performance, but they leave out the fact that the tap point (tap voltage) makes a big difference too!
The SEL paper is better, but it fails to consider the affect of actual applied burdens on the TR performance of CCVTs.
jbartos-
The GE link for the VTs you posted seems well outdated...still referencing the Class A type CCVTs, which is an old term from the old CCVT NEMA standard. Modern CCVTs are not rated like that any more and there have been many strides in the design in the last few decades.