Capability predictions can be done for both position tolerances with constant value specification limits (RFS) and position specifications with variable specification limits (MMC / LMC).
The problem with doing these predictions with variable specification limits is that the basic formulas for Cpk-Ppk are designed only for constant value limits. That problem can be fixed by changing the equation to include the variable portion of tolerance and its inherent variation. The variable portion of tolerance is a distribution itself. It is actually the distribution for size and if that distribution is considered properly in relation to the distribution for the position deviation then the interference of the two distributions represents the “probability of a defect” for a variable limit tolerance.
If you were to make a histogram for a position deviation distribution you would likely see a skewed distribution with greater frequencies of smaller deviations crowding the lower boundary (zero position) and fewer frequencies larger deviations approaching or even exceeding the USL. To make that histogram reflective of a variable tolerance you would need to show the distribution for size on the same graph. To do that you must recognize that the (zero position) boundary corresponds to the “virtual condition size”, the USL corresponds to the size limit that represents the minimum variable tolerance, and the position tolerance extends to the value for size that represents the maximum variable tolerance or the “resultant condition”.
When you align the legend values for size and position next to each other you will see that the values ascend and descend correspondingly for holes with tolerances specified at MMC and shafts at LMC. Consequently the values ascend and descend in opposite directions for holes at LMC and shafts at MMC.
If you have done the histogram properly you will see two distributions side by side, one for position (typically skewed) and one for size (typically normal). The area of the intersection of those two distributions reflects the probability of a defect for a “variable limit” tolerance and if both distributions were “normal” it could be accurately estimated by using the classic reliability formula for strength vs. stress.
I posted a presentation that I gave at a conference last year to another forum. It is toward the end of the 2nd page of comments,
and it explains this process better with pictures (ppkmmc.pdf) and you will find two spreadsheets there (ppkmmcxy.xls & ppkmmc.xls) that graph and perform these calculations with your data.
BTW
Dave, I agree with some of your comments and disagree with others.
You are correct when you say that “a positional tolerance at MMC reflects a virtual condition boundary” and incorrect when you say “not centers”. Read on in the standard… section 5.3.2.1 (a) & (b).
Again you are correct when you caution that the capability analysis does not address “Datum Shift” To correctly address datum feature tolerance modifiers all features identically referenced from the from the same “mobile” datum reference must be considered simultaneously. Therefore the freedom to shift the datum reference cannot be applied in unique magnitudes and directions to the various individual features. Attribute “go position gages” (when they encompass all features that have these simultaneous requirements) prevent this freedom from being applied improperly. To do it analytically, from size and coordinate data, for numerous features that each have unique amounts of variable position tolerance is as you say “a real mess”.
The reason that Attribute “go position gages” are undesirable for manufacturing is that with current customer requirements for quality or capability demonstration the number of samples required for an attribute check to demonstrate conformance to the specification is astronomical. If a customer expects that the probability of a defect reflects 1.33 Cpk then there can be no more than 1 defect in 31,574 parts and if that requirement is 1.67 Cpk then there can be no more than 1 defect in 3,488,555 parts. Consider the sample sizes required for these frequencies with some minimum repetition of non-conformance to make valid predictions. That is why a continuous data capability study is preferred for these tolerances.
Paul F. Jackson