Recently came across a drawing spec, where a datum was defined onto a feature control frame, and the feature control frame had the same datum as secondary.
In the picture, Datum 'B' is defined to a profile of surface FCF, which uses Datum 'B' itself as secondary. (It is a flat surface that FCF...
Could anyone clarify, if the position measurement is a centroid feature or does it apply to all points on the surface?
Attached file explains different target strategy for position measurement in a measurement software. It will be helpful to know which one is the right strategy to be used...
