The promise of autonomous vehicles is driving profound changes in the design and testing of automotive semiconductor parts. The ICs for safety-critical applications need to meet the ISO 26262 standard for functional safety. Among the challenges in the design flow has been aligning the metrics for design-for-test and for functional safety.

This paper describes using logic built-in-self-test as both a functional safety mechanism and as a part of in-system testing, which allows for alignment of metrics required for safety certifications.

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