×
INTELLIGENT WORK FORUMS
FOR ENGINEERING PROFESSIONALS

Log In

Come Join Us!

Are you an
Engineering professional?
Join Eng-Tips Forums!
  • Talk With Other Members
  • Be Notified Of Responses
    To Your Posts
  • Keyword Search
  • One-Click Access To Your
    Favorite Forums
  • Automated Signatures
    On Your Posts
  • Best Of All, It's Free!
*Eng-Tips's functionality depends on members receiving e-mail. By joining you are opting in to receive e-mail.

Posting Guidelines

Promoting, selling, recruiting, coursework and thesis posting is forbidden.

Students Click Here
Home > Resources

White Paper - Getting Started with Critical Area Analysis

Critical area analysis (CAA) can be used by both designers and foundries to directly improve the manufacturability, and ultimately the profitability, of IC designs. In this white paper we introduce the concept of defect density data for critical area analysis and how it can impact yield.

Learn more about how to:

  • Identify design geometries susceptible to random defects during manufacturing
  • Adjust the manufacturing processes to reduce the occurrence of random defects for given geometries
  • Generate defect density data from test chips
  • Predict defect limited yield before tapeout

To download, please complete the form on this page. Your download is sponsored by Mentor, a Siemens Business.

Get Your Resource

Please provide the following to access your download.
Close Box

Join Eng-Tips® Today!

Join your peers on the Internet's largest technical engineering professional community.
It's easy to join and it's free.

Here's Why Members Love Eng-Tips Forums:

Register now while it's still free!

Already a member? Close this window and log in.

Join Us             Close