The idea behind the project is to create a method of analysis for multi-layered thin film structures. This is a test of data that is already known (not fabricated). We are analyzing the light across 850 different wavelengths of light (not just a few), so across the data there are significant...
Hey all, I'm trying to create a method of analysis of the optical properties of layered materials, but I've encountered some difficulty. We are using the Fresnel equation for Reflectance to calculate the n value, k value, and thickness (d) of a certain material on a substrate. The formula is...
