Multiple Values in Patterns
Multiple Values in Patterns
(OP)
As a former I-Deas house, one of the most missed features is the ability to input multiple values into a pattern. Now we have learned to live with it so to speak, to use clock or other techniques which do not work as well.
But now the problem is when migrating I-Deas data into NX (NX5 BTW) all of the patterns that had multiple values will fail as an unsupported feature in NX and be created as BREPs.
Now I only hope there are plans for this to be incorporated into NX as it is a very useful feature AND it will increase the I-Deas to NX feature migration success rate.
Any thoughts on this? Am I alone in wanting this feature in future versions of NX?
But now the problem is when migrating I-Deas data into NX (NX5 BTW) all of the patterns that had multiple values will fail as an unsupported feature in NX and be created as BREPs.
Now I only hope there are plans for this to be incorporated into NX as it is a very useful feature AND it will increase the I-Deas to NX feature migration success rate.
Any thoughts on this? Am I alone in wanting this feature in future versions of NX?





RE: Multiple Values in Patterns
John R. Baker, P.E.
Product 'Evangelist'
NX Design
Siemens PLM Software Inc.
Cypress, CA
http://www.siemens.com/plm
http://www.plmworld.org/museum/