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White Paper - MEMS Jumpstart Series: Preparing for Finite Element Analysis

Sensor engineers are challenged to assess the performance of Micro Electro-Mechanical Systems (MEMS).

Using finite element analysis (FEA), engineers can predict MEMS performance in the real world.

In this six-page white paper, you will learn:
  • How the fabrication process affects FEA
  • How to generate a 3D model of the MEMS for FEA
  • How to optimize FEA to ensure accurate results

About the Author:

Nicolas Williams is a product marketing manager at Mentor Graphics. Williams also worked at Tanner EDA and Tanner Research as a product manager for 18 years.


Complete the form on this page to download your free white paper. Your download is sponsored by Mentor Graphics.

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